1. Zone melting - a process wherein a small portion (zone) of the silicon rod is heated through magnetic induction until it melts
2. The heater is slowly moved down the length of the rod, keeping a zone molten as the silicon cools and resolidifies behind it
3. Since most impurities tend to remain in the molten region rather than resolidify, when the process is complete, most of the impurities in the rod will have been moved into the end that was the last to be melted
4. This end is then cut off and discarded, and the process repeated if a still higher purity was desired
1. Chemical Vapor Deposition - a vessel which is evacuated and that contains "U" shaped arrangements of slim Si rods which can be heated from an outside heating source
2. As soon as the temperature is high enough (roughly 1000 °C) to provide sufficient conductivity, by passing an electrical current through it
3. An optimized mix of SiHCl3 (Trichlorosilane), H2 and doping gases like AsH3 or PH3 are admitted into the reactor
1. After lapping, wafers are etched in a solution of nitric acid / acetic acid or sodium hydroxide to remove microscopic cracks or surface damage created by the lapping process
2. The acid or caustic solution is removed by a series of high-purity DI water baths
1. Most wafer manufacturers use a 3-step process which starts with an SC1 solution (ammonia, hydrogen peroxide and DI water) to remove organic impurities and particles from the wafer surface
2. Next, natural oxides and metal impurities are removed with hydrofluoric acid
3. Finally, the SC2 solution, (hydrochloric acid and hydrogen peroxide), causes super clean new natural oxides to grow on the surface
Complete IC fabrication process has many individual processing steps (>100) and can take several weeks to carry out
Each process step accurately controlled in order to give acceptable overall result (high process yield)
For a typical IC chip of area 1cm × 1cm containing 1 million or more components each component in the order of fractions of a µms (human hair approximately 50µm diameter)
Patterning defines the component sizes - currently 0.13µm (130nm) - Deep Sub-micron technology
Very thin layers (1-10µm) of accurately controlled doped silicon is 'grown' onto the wafer in such a way that the crystal structure is continuous between the substrate and the epitaxial layer
Trichlorosilicane gas (SiHCl3) is admitted into a reaction chamber under high temperature which decomposes and deposits pure Si on the surface of the wafer (Siemens Process)
1. Process which effectively transfers the chip layout on a mask onto the silicon surface - has similarities to photographic printing
2. Objective is to enable many (millions) of shapes to be printed on the wafer in one operation (with enormous cost benefits)
3. Most important process as far as ensuring that the various components line up with each other and are interconnected correctly (determines line width)
Doping is accomplished by exposing the wafer to a dopant gas, under high temperature and pressure, depositing a layer of dopant material on the wafer's surface. These particles must then diffuse into the silicon
A layer of material spread evenly on the surface of the wafer that dissolves upon exposure to ultraviolet light, leaving a pattern on the wafer's surface dictated by a mask
A template that contains the pattern for the different layers to be made on the chip. The mask, together with a stepper, imposes the patterns on the wafer's surface (hundreds per wafer)
1. Exposing the wafer to a dopant gas, under high temperature and pressure, depositing a layer of dopant material on the wafer's surface
2. Diffusion (or solid state diffusion) is the process whereby a solid will physically diffuse itself into another solid in close contact with it due to the random thermal movement of atoms
3. Essentially zero at room temperatures and up to 300-400ºC, over long periods at normal operating temperatures
4. At high temperatures (>1,000ºC) diffusion increases considerably
1. Firing high energy atoms of the dopant elements, onto the silicon wafer
2. The ions travel a small distance (typically <1µm) into the wafer before losing their energy and being absorbed
3. Annealing process at temperatures of about 600ºC for a short time to repair the mechanical damage caused by the high energy ions and also to cause ions to fit into the silicon crystal lattice substitutionally
Formed by depositing silicon onto the wafer and is used as an interconnect between parts of the chip (highly doped in order to reduce resistance) or for passivation (undoped to increase its resistance)
ICs contain a very large number of transistors and other components formed in the silicon wafer surface
The components have to be interconnected to form a working circuit using a low resistance material (metal) - usually aluminum - that is compatible with the silicon fabrication process (metallization)
Copper also now also used to reduce voltage drops and increase power levels
Polysilicon also used as it offers the ability to form extra layers relatively easily but its resistance is higher than a metal
Removed material in all directions (isotropic) thus removing the masking material also resulting in a change in the pattern dimensions from original layout/mask (undercutting)
Anisotropic processes were developed, in which it only removed material in one direction (normally vertically) overcoming undercutting, giving a faithful representation of the mask pattern on the silicon wafer